ASDL
ASDL
News
Publications, conferences, awards and life in the lab.
Conference · Jul 2025
한국광학회 하계학술발표회 OPC2025 제주, Tutorial - Co-packaged optics & Si Photonics
Prof. Kim delivered an invited oral presentation at the Tutorial Session of OPC 2025, highlighting recent advances in Co-packaged optics and silicon photonics.
Conference · Jul 2025
한국광학회 하계학술대회 OPC2025 제주, Student Presentations (7 Posters)
We presented our works at The OPC 2025.
Conference · Jul 2025
OECC2025 Sapporo, Student Oral Presentation
Heeyun Jung presented his works at The OECC2025.
News · Jun 2025
Undergraduate Students Won Prizes in 2025 Capstone Design Competition
ASDL Undergraduate Teams Won Excellence and Encouragement Prizes in 2025 Capstone Competition
Journal Publication · May 2025
Visible Light Wavelength-Dependent Erasing in AOS-Based Charge Trap TFTs for Enhanced Neuromorphic Display Performance
Optoelectronic synapse with R, G, B light-driven plasticity. All colors induce synaptic modulation, with Blue showing the highest performance, followed by Green and Red.
ASDL Spring Social Event 2025 · May 2025
Marathon
지치지 않는 연구를 위한 체력의 시작점, 함께 달려 더 단단해진 팀워크!
News · Feb 2025
2025년 학부 및 대학원 졸업식
빛나는 여정의 마침표이자 새로운 출발점!
News · Jan 2025
Student Award, 2025 ERICA Convergence Conference Award
Master student Seoungmin Park received an encouragement award at the ERICA Convergence Conference.
Journal Publication · Jan 2025
Status of Co-Packaged Optics based on Silicon Photonics
Next-Generation Semiconductor Packaging: Current Status of Research and Development on Co-packaged Optics Based on Silicon Photonics
News · Dec 2024
ASDL Winter social event 2024
In the second half of 2024, professors and ASDL students gathered together for a year-end party to wrap up the year.
News · Dec 2024
Graduate Students Won Prizes in G-Capstone Competition
In the graduate student G-Capstone competition, the Mips team (Team Leader: Seoungmin Park) won the grand prize (2st prize).
Journal Publication · Dec 2024
Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testing
Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testing