Conference-ECOC2022, Basel (top-tier conference in optical communication)

We report the reliability assessment of carrier-depletion GaAs optical modulators monolithically integrated on a 300-mm Si wafer. Dark current remains stable under long accelerating aging tests. Devices without seed annealing experience a shift of Vπ.Lπ with no stress temperature dependence.

• Front slide of presentation

• Abstract

• Program schedule

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